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Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices.
Philippe Soussan
G. Lekens
R. Dreesen
Ward De Ceuninck
Eric Beyne
Published in:
Microelectron. Reliab. (2003)
Keyphrases
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mobile devices
software aging
user friendly
discrete space
reliability analysis
databases
neural network
data mining
genetic algorithm
decision trees
feature extraction
software tools
highly reliable