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High-resolution in-situ of gold electromigration: test time reduction.
Kris Croes
R. Dreesen
Jean Manca
Ward De Ceuninck
Luc De Schepper
Luc Tielemans
P. J. van der Wel
Published in:
Microelectron. Reliab. (2001)
Keyphrases
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high resolution
low resolution
image processing
high quality
high frequency
super resolution
reduction method
high resolution images
field of view
test cases
remote sensing
low resolution images
real time
color images
multiresolution
feature extraction
statistical significance
neural network