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A new degradation model and lifetime extrapolation technique for lightly doped drain nMOSFETs under hot-carrier degradation.

R. DreesenKris CroesJean MancaWard De CeuninckLuc De SchepperA. PergootGuido Groeseneken
Published in: Microelectron. Reliab. (2001)
Keyphrases
  • high level
  • formal model
  • database
  • cost function
  • management system
  • experimental data
  • analytical model
  • genetic algorithm
  • image segmentation
  • hidden markov models
  • theoretical analysis
  • parameter values
  • autoregressive