MIMC reliability and electrical behavior defined by a physical layer property of the dielectric.
Jan AckaertR. CharavelK. DhondtB. VlachakisLuc De SchepperM. MillecamE. VandeveldeP. BogaertA. IlineEddy De BackerAlexandru VladJean-Pierre RaskinPublished in: Microelectron. Reliab. (2008)