A new method for the analysis of high-resolution SILC data.
Stefano AresuWard De CeuninckG. KnuytJ. MertensJean MancaLuc De SchepperRobin DegraeveBen KaczerMarc D'OlieslaegerJan D'HaenPublished in: Microelectron. Reliab. (2003)
Keyphrases
- synthetic data
- correlation analysis
- data analysis
- test data
- input data
- high quality
- prior knowledge
- high resolution
- significant improvement
- high accuracy
- data sets
- missing data
- statistical methods
- data sources
- information loss
- statistical analysis
- noisy data
- detection method
- low resolution
- data mining
- data mining techniques
- data points
- probability distribution
- pairwise
- image data
- probabilistic model
- data acquisition
- original data
- preprocessing
- data quality
- training data
- reconstruction method
- similarity measure
- quantitative measurements