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Evidence for source side injection hot carrier effects on lateral DMOS transistors.

Stefano AresuWard De CeuninckGeert Van den BoschGuido GroesenekenPeter MoensJean MancaD. WojciechowskiP. Gassot
Published in: Microelectron. Reliab. (2004)
Keyphrases
  • empirical evidence
  • information systems
  • multiple sources
  • database
  • artificial intelligence
  • case study
  • image segmentation
  • multiscale
  • medical images
  • steady state
  • dempster shafer theory