A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure.
Kris VanstreelsMarc D'OlieslaegerWard De CeuninckJan D'HaenKaren MaexPublished in: Microelectron. Reliab. (2005)
Keyphrases
- cost function
- experimental evaluation
- high accuracy
- detection method
- similarity measure
- synthetic data
- objective function
- significant improvement
- optimization algorithm
- high precision
- pairwise
- tree structure
- edge detection
- clustering method
- support vector machine
- fully automatic
- learning algorithm
- prior knowledge
- training data
- face recognition