Karen Maex

Publication Activity (10 Years)

Years Active: 2000-2007
Publications (10 Years): 0

Publications

Georges G. E. Gielen, Wim Dehaene, Phillip Christie, Dieter Draxelmayr, Edmond Janssens, Karen Maex, Ted Vucurevich
Analog and Digital Circuit Design in 65 nm CMOS: End of the Road? CoRR (2007)
Evelyn Grossar, Michele Stucchi, Karen Maex, Wim Dehaene
Statistically Aware SRAM Memory Array Design. ISQED (2006)
Mandeep Bamal, Youssef Travaly, Wenqi Zhang, Michele Stucchi, Karen Maex
Impact of interconnect resistance increase on system performance of low power and high performance designs. SLIP (2006)
Evelyn Grossar, Michele Stucchi, Karen Maex, Wim Dehaene
Read Stability and Write-Ability Analysis of SRAM Cells for Nanometer Technologies. IEEE J. Solid State Circuits 41 (11) (2006)
Georges G. E. Gielen, Wim Dehaene, Phillip Christie, Dieter Draxelmayr, Edmond Janssens, Karen Maex, Ted Vucurevich
Analog and Digital Circuit Design in 65 nm CMOS: End of the Road? DATE (2005)
Kris Vanstreels, Marc D'Olieslaeger, Ward De Ceuninck, Jan D'Haen, Karen Maex
A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure. Microelectron. Reliab. 45 (3-4) (2005)
Y.-L. Li, Zsolt Tokei, Philippe Roussel, Guido Groeseneken, Karen Maex
Layout dependency induced deviation from Poisson area scaling in BEOL dielectric reliability. Microelectron. Reliab. 45 (9-11) (2005)
Hua Wang, Miguel Miranda, Wim Dehaene, Francky Catthoor, Karen Maex
Systematic Analysis of Energy and Delay Impact of Very Deep Submicron Process Variability Effects in Embedded SRAM Modules. DATE (2005)
Francky Catthoor, Andrea Cuomo, Grant Martin, Patrick Groeneveld, Rudy Lauwereins, Karen Maex, Patrick van de Steeg, Ron Wilson
How Can System-Level Design Solve the Interconnect Technology Scaling Problem? DATE (2004)
Mandeep Bamal, Evelyn Grossar, Michele Stucchi, Karen Maex
Interconnect width selection for deep submicron designs using the table lookup method. SLIP (2004)
Antonis Papanikolaou, Miguel Miranda, Francky Catthoor, Henk Corporaal, Hugo De Man, David De Roest, Michele Stucchi, Karen Maex
Global interconnect trade-off for technology over memory modules to application level: case study. SLIP (2003)
Antonis Papanikolaou, Miguel Miranda, Francky Catthoor, Henk Corporaal, Hugo De Man, David De Roest, Michele Stucchi, Karen Maex
Interconnect exploration for future wire dominated technologies. SLIP (2002)
Michele Stucchi, Karen Maex
Frequency dependence in interline capacitance measurements. IEEE Trans. Instrum. Meas. 51 (3) (2002)
Hasan Ymeri, Bart Nauwelaers, Karen Maex, Servaas Vandenberghe, David De Roest
A CAD-oriented analytical model for frequency-dependent series resistance and inductance of microstrip on-chip interconnect on silicon substrate. Microprocess. Microsystems 26 (1) (2002)
Hasan Ymeri, Bart Nauwelaers, Karen Maex, David De Roest, Michele Stucchi, Servaas Vandenberghe
Simple and Efficient Approach for Shunt Admittance Parameters Calculations of VLSI On-Chip Interconnects on Semiconducting Substrate. DATE (2002)
Hasan Ymeri, Bart Nauwelaers, Karen Maex
On the two-dimensional capacitance calculation of multiconductor multilayered interconnects. Ann. des Télécommunications 56 (9-10) (2001)
Hasan Ymeri, Bart Nauwelaers, Karen Maex
Frequency-dependent mutual resistance and inductance formulas for coupled IC interconnects on an Si-SiO2 substrate. Integr. 30 (2) (2001)
Hasan Ymeri, Bart Nauwelaers, Karen Maex
Computation of capacitance matrix for integrated circuit interconnects using semi-analytic Green's function method. Integr. 30 (1) (2000)