Frequency dependence in interline capacitance measurements.
Michele StucchiKaren MaexPublished in: IEEE Trans. Instrum. Meas. (2002)
Keyphrases
- high speed
- low frequency
- high frequency
- measurement noise
- knowledge base
- data sets
- computer vision
- frequency distribution
- multiscale
- low power
- unit length
- real time
- dependence structure
- sensor measurements
- probability distribution
- association rules
- bayesian networks
- image segmentation
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- information retrieval
- neural network