Kris Vanstreels

Publication Activity (10 Years)

Years Active: 2004-2015
Publications (10 Years): 1

Top Topics

Gpu Accelerated

Finite Element Model

Top Venues

Microelectron. Reliab.

Publications

Joke De Messemaeker, O. Varela Pedreira, A. Moussa, Nabi Nabiollahi, Kris Vanstreels, Stefaan Van Huylenbroeck, Harold Philipsen, Patrick Verdonck, Bart Vandevelde, Ingrid De Wolf, Eric Beyne, Kris Croes
Impact of oxide liner properties on TSV Cu pumping and TSV stress. IRPS (2015)
Bart Vandevelde, Andrej Ivankovic, B. Debecker, Melina Lofrano, Kris Vanstreels, Wei Guo, Vladimir Cherman, Marcel Gonzalez, Geert Van der Plas, Ingrid De Wolf, Eric Beyne, Zsolt Tokei
Chip-Package Interaction in 3D stacked IC packages using Finite Element Modelling. Microelectron. Reliab. 54 (6-7) (2014)
Yun-Hsuan Chen, Maaike Op de Beeck, Luc Vanderheyden, Evelien Carrette, Vojkan Mihajlovic, Kris Vanstreels, Bernard Grundlehner, Stefanie Gadeyne, Paul Boon, Chris Van Hoof
Soft, Comfortable Polymer Dry Electrodes for High Quality ECG and EEG Recording. Sensors 14 (12) (2014)
Biljana Dimcic, Riet Labie, Joke De Messemaeker, Kris Vanstreels, Kris Croes, Bert Verlinden, Ingrid De Wolf
Sn phase in the bump and thin film Cu/Sn structures. Microelectron. Reliab. 52 (9-10) (2012)
Andrej Ivankovic, Kris Vanstreels, Daniel Vanderstraeten, Guy Brizar, Renaud Gillon, Eddy Blansaer, Bart Vandevelde
Comparison of experimental methods for the extraction of the elastic modulus of molding compounds used in IC packaging. Microelectron. Reliab. 52 (11) (2012)
Ingrid De Wolf, Kris Croes, O. Varela Pedreira, Riet Labie, Augusto Redolfi, M. Van De Peer, Kris Vanstreels, C. Okoro, Bart Vandevelde, Eric Beyne
Cu pumping in TSVs: Effect of pre-CMP thermal budget. Microelectron. Reliab. 51 (9-11) (2011)
Kris Vanstreels, Marc D'Olieslaeger, Ward De Ceuninck, Jan D'Haen, Karen Maex
A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure. Microelectron. Reliab. 45 (3-4) (2005)
Leen Biesemans, K. Schepers, Kris Vanstreels, Jan D'Haen, Ward De Ceuninck, Marc D'Olieslaeger
MTF test system with AC based dynamic joule correction for electromigration tests on interconnects. Microelectron. Reliab. 44 (9-11) (2004)