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- Seiichi Miyazaki
- Tibor Grasser
- T. Yoshida
- Yuki Atsumi
- Kuniyuki Kakushima
- Hei Wong
- Hiroshi Iwai
- Kazuo Tsutsui
- Nobuyuki Sugii
- E. Omoda
- Akio Ohta
- A. A. Dakhel
- Youichi Sakakibara
- Chin-Long Wey
- Katsunori Makihara
- Parhat Ahmet
- Takamasa Kawanago
- Luigi Zeni
- Akihiro Noriki
- Norbert Meier
- Mohammad Athar Khalil
- Takeo Hattori
- Nunzio Cennamo
- Tymon Barwicz
- Shinichi Takagi
- Bert Jan Offrein
- Ming-Dou Ker
- Hee-Dong Kim
- Folkert Horst
- T. V. Torchynska
- Al-Moatasem El-Sayed
- Ching-Lin Fan
- Wen-Fa Wu
- Manuel Rosenberger
- Paulo R. F. Rocha
- Joseph Ya-min Lee
- Mitsumasa Koyanagi
- Ricardo Ascázubi
- S. J. Ben Yoo
Venues
- Sensors
- Microelectron. Reliab.
- OFC
- IEICE Trans. Electron.
- NEMS
- Microelectron. J.
- IBM J. Res. Dev.
- IEEE SENSORS
- IEEE Access
- IEEE Trans. Instrum. Meas.
- IEICE Electron. Express
- IRPS
- CoRR
- ESSDERC
- INFORSID
- IEEE J. Solid State Circuits
- IEEE Trans. Biomed. Eng.
- ECOC
- CCE
- Sci. China Inf. Sci.
- VLSI Design
- Proc. IEEE
- ICTON
- J. Sensors
- J. Chem. Inf. Model.
- 3DIC
- J. Comput. Chem.
- Int. J. Autom. Technol.
- EIT
- DATE
- ISCAS
- ISSCC
- OECC/PSC
- I2MTC
- DRC
- Inform. Spektrum
- Int. J. Manuf. Technol. Manag.
- IET Circuits Devices Syst.
- J. Comput. Methods Sci. Eng.
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