Takeo Hattori

Publication Activity (10 Years)

Years Active: 2006-2012
Publications (10 Years): 0

Top Topics

Friendly Interface

Top Venues

Microelectron. Reliab.

Publications

M. Mamatrishat, T. Kubota, T. Seki, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Yoshinori Kataoka, Akira Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Hiroshi Iwai
/Si MOS capacitors. Microelectron. Reliab. 52 (6) (2012)
Takamasa Kawanago, Kuniyuki Kakushima, Parhat Ahmet, Yoshinori Kataoka, Akira Nishiyama, Nobuyuki Sugii, Kazuo Tsutsui, Kenji Natori, Takeo Hattori, Hiroshi Iwai
(100)- and (110)-oriented nMOSFETs with highly scaled EOT in La-silicate/Si interface for multi-gate architecture. ESSDERC (2012)
Chunmeng Dou, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Akira Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Hiroshi Iwai
based ReRAM cell incorporated with Si buffer layer. Microelectron. Reliab. 52 (4) (2012)
D. Zade, Soshi Sato, Kuniyuki Kakushima, A. Srivastava, Parhat Ahmet, Kazuo Tsutsui, Akira Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Chandan Kumar Sarkar, Hiroshi Iwai
gated nMOSFETs on low-frequency noise. Microelectron. Reliab. 51 (4) (2011)
Kuniyuki Kakushima, K. Okamoto, T. Koyanagi, M. Kouda, Kiichi Tachi, Takamasa Kawanago, J. Song, Parhat Ahmet, Hiroshi Nohira, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai
/Ce-silicate gate dielectrics. Microelectron. Reliab. 50 (3) (2010)
Kuniyuki Kakushima, Kiichi Tachi, Parhat Ahmet, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai
gate dielectrics. Microelectron. Reliab. 50 (6) (2010)
Parhat Ahmet, Kentaro Nakagawa, Kuniyuki Kakushima, Hiroshi Nohira, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai
gate stack. Microelectron. Reliab. 48 (11-12) (2008)
Takeo Hattori, Hiroshi Nohira, S. Shinagawa, M. Hori, M. Kase, T. Maruizumi
Angle-resolved photoelectron spectroscopy on gate insulators. Microelectron. Reliab. 47 (1) (2007)
Joel Molina Reyes, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai
gated MOSFET structures after electrical stress. IEICE Electron. Express 4 (6) (2007)
Jin-Aun Ng, Nobuyuki Sugii, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Takeo Hattori, Hiroshi Iwai
nMISFETs after post deposition annealing. IEICE Electron. Express 3 (13) (2006)