gate dielectrics.

Kuniyuki Kakushima Kiichi Tachi Parhat Ahmet Kazuo Tsutsui Nobuyuki Sugii Takeo Hattori Hiroshi Iwai

Published in: Microelectron. Reliab. (2010)

Keyphrases

gate dielectrics
electrical properties
si sio
field effect transistors
dynamic programming
hopfield neural network