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/Si MOS capacitors.

M. MamatrishatT. KubotaT. SekiKuniyuki KakushimaParhat AhmetKazuo TsutsuiYoshinori KataokaAkira NishiyamaNobuyuki SugiiKenji NatoriTakeo HattoriHiroshi Iwai
Published in: Microelectron. Reliab. (2012)
Keyphrases
  • metal oxide
  • si sio
  • x ray
  • integrated circuit
  • solid state
  • real time
  • computer vision
  • decision making
  • knowledge base
  • three dimensional
  • multiscale
  • optimal solution
  • database replication