Soshi Sato

Publication Activity (10 Years)

Years Active: 2011-2019
Publications (10 Years): 2

Top Topics

Metal Oxide Semiconductor

Number Of Test Cases

Electrical Properties

Testing Process

Top Venues

Microelectron. Reliab.

Publications

Ryo Tamura, N. Watanabe, Hiroki Koike, Hideo Sato, Shoji Ikeda, Tetsuo Endoh, Soshi Sato
A novel memory test system with an electromagnet for STT-MRAM testing. NVMTS (2019)
Soshi Sato, Kikuo Yamabe, Tetsuo Endoh, Masaaki Niwa
Formation mechanism of concave by dielectric breakdown on silicon carbide metal-oxide-semiconductor capacitor. Microelectron. Reliab. 58 (2016)
D. Zade, Soshi Sato, Kuniyuki Kakushima, A. Srivastava, Parhat Ahmet, Kazuo Tsutsui, Akira Nishiyama, Nobuyuki Sugii, Kenji Natori, Takeo Hattori, Chandan Kumar Sarkar, Hiroshi Iwai
gated nMOSFETs on low-frequency noise. Microelectron. Reliab. 51 (4) (2011)
Soshi Sato, Kuniyuki Kakushima, Parhat Ahmet, Kenji Ohmori, Kenji Natori, Keisaku Yamada, Hiroshi Iwai
Structural advantages of rectangular-like channel cross-section on electrical characteristics of silicon nanowire field-effect transistors. Microelectron. Reliab. 51 (5) (2011)