Kikuo Yamabe

Publication Activity (10 Years)

Years Active: 2013-2019
Publications (10 Years): 3

Top Topics

Gate Dielectrics

Chemical Vapor Deposition

Electrical Properties

Top Venues

Microelectron. Reliab.

Publications

Hideya Matsuyama, Takashi Suzuki, Motoki Shiozu, Hideo Ehara, Takeshi Soeda, Hirokazu Hosoi, Masao Oshima, Kikuo Yamabe
Verification of Copper Stress Migration Under Low Temperature Long Time Stress. IRPS (2019)
Yusuke Higashi, Riichiro Takaishi, Koichi Kato, Masamichi Suzuki, Yasushi Nakasaki, Mitsuhiro Tomita, Yuichiro Mitani, Masuaki Matsumoto, Shohei Ogura, Katsuyuki Fukutani, Kikuo Yamabe
Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface. Microelectron. Reliab. 70 (2017)
Soshi Sato, Kikuo Yamabe, Tetsuo Endoh, Masaaki Niwa
Formation mechanism of concave by dielectric breakdown on silicon carbide metal-oxide-semiconductor capacitor. Microelectron. Reliab. 58 (2016)
Izumi Hirano, Yasushi Nakasaki, Shigeto Fukatsu, Masakazu Goto, Koji Nagatomo, Seiji Inumiya, Katsuyuki Sekine, Yuichiro Mitani, Kikuo Yamabe
Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing. Microelectron. Reliab. 53 (12) (2013)