Yasushi Nakasaki

Publication Activity (10 Years)

Years Active: 2013-2023
Publications (10 Years): 5

Top Topics

Comprehensive Analysis

Electrical Properties

Top Venues

Microelectron. Reliab.

Publications

Harumi Seki, Reika Ichihara, Yusuke Higashi, Yasushi Nakasaki, Masumi Saitoh, Masamichi Suzuki
Comprehensive Analysis of Hole-Trapping in SiN Films with a Wide Range of Time Constants Based on Dynamic C-V. IRPS (2023)
Harumi Seki, Yasushi Nakasaki, Yuichiro Mitani
Further Investigation on Mechanism of Trap Level Modulation in Silicon Nitride Films by Fluorine Incorporation. IRPS (2020)
Yuichiro Mitani, Yusuke Higashi, Yasushi Nakasaki
Study on mechanism of thermal curing in ultra-thin gate dielectrics. IRPS (2018)
Marina Yamaguchi, Shosuke Fujii, Yuuichi Kamimuta, Shoichi Kabuyanagi, Tsunehiro Ino, Yasushi Nakasaki, Riichiro Takaishi, Reika Ichihara, Masumi Saitoh
Impact of specific failure mechanisms on endurance improvement for HfO2-based ferroelectric tunnel junction memory. IRPS (2018)
Yusuke Higashi, Riichiro Takaishi, Koichi Kato, Masamichi Suzuki, Yasushi Nakasaki, Mitsuhiro Tomita, Yuichiro Mitani, Masuaki Matsumoto, Shohei Ogura, Katsuyuki Fukutani, Kikuo Yamabe
Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface. Microelectron. Reliab. 70 (2017)
Izumi Hirano, Yasushi Nakasaki, Shigeto Fukatsu, Masakazu Goto, Koji Nagatomo, Seiji Inumiya, Katsuyuki Sekine, Yuichiro Mitani, Kikuo Yamabe
Time-dependent dielectric breakdown (TDDB) distribution in n-MOSFET with HfSiON gate dielectrics under DC and AC stressing. Microelectron. Reliab. 53 (12) (2013)