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Comprehensive Analysis of Hole-Trapping in SiN Films with a Wide Range of Time Constants Based on Dynamic C-V.
Harumi Seki
Reika Ichihara
Yusuke Higashi
Yasushi Nakasaki
Masumi Saitoh
Masamichi Suzuki
Published in:
IRPS (2023)
Keyphrases
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comprehensive analysis
wide range
real world
dynamic environments
dynamically changing
database
artificial intelligence
learning environment