Masamichi Suzuki

Publication Activity (10 Years)

Years Active: 2010-2023
Publications (10 Years): 3

Top Topics

Analog Circuits

Comprehensive Analysis

Chemical Vapor Deposition

Top Venues

IEEE Trans. Circuits Syst. II Express Briefs

Microelectron. Reliab.

Publications

Harumi Seki, Reika Ichihara, Yusuke Higashi, Yasushi Nakasaki, Masumi Saitoh, Masamichi Suzuki
Comprehensive Analysis of Hole-Trapping in SiN Films with a Wide Range of Time Constants Based on Dynamic C-V. IRPS (2023)
Yusuke Higashi, Riichiro Takaishi, Koichi Kato, Masamichi Suzuki, Yasushi Nakasaki, Mitsuhiro Tomita, Yuichiro Mitani, Masuaki Matsumoto, Shohei Ogura, Katsuyuki Fukutani, Kikuo Yamabe
Mechanism of gate dielectric degradation by hydrogen migration from the cathode interface. Microelectron. Reliab. 70 (2017)
Takao Marukame, Kodai Ueyoshi, Tetsuya Asai, Masato Motomura, Alexandre Schmid, Masamichi Suzuki, Yusuke Higashi, Yuichiro Mitani
Error Tolerance Analysis of Deep Learning Hardware Using a Restricted Boltzmann Machine Toward Low-Power Memory Implementation. IEEE Trans. Circuits Syst. II Express Briefs (4) (2017)
Masamichi Suzuki, Atsuhiro Kinoshita, Yuichiro Mitani
Improvement of gate disturb degradation in SONOS FETs for Vth mismatch compensation in CMOS analog circuits. ICICDT (2013)
Masamichi Suzuki, Masato Koyama, Atsuhiro Kinoshita
Detailed investigation of the effects of La and Al content on the electrical characteristics and reliability properties of La-Al-O gate dielectrics. Microelectron. Reliab. 50 (12) (2010)