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gated nMOSFETs on low-frequency noise.

D. ZadeSoshi SatoKuniyuki KakushimaA. SrivastavaParhat AhmetKazuo TsutsuiAkira NishiyamaNobuyuki SugiiKenji NatoriTakeo HattoriChandan Kumar SarkarHiroshi Iwai
Published in: Microelectron. Reliab. (2011)
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