Joel Molina Reyes

Publication Activity (10 Years)

Years Active: 2005-2019
Publications (10 Years): 5

Top Topics

Spatio Temporal Databases

Room Temperature

Top Venues

Microelectron. Reliab.

Publications

Fernando Leonel Aguirre, Andrea Padovani, Alok Ranjan, Nagarajan Raghavan, Nahuel Vega, Nahuel Muller, Sebastián Matías Pazos, Mario Debray, Joel Molina Reyes, Kin Leong Pey, Felix Palumbo
Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms. IRPS (2019)
Joel Molina Reyes, H. Uribe-Vargas
Room temperature resonant tunneling in metal-insulator-insulator-insulator-semiconductor devices. DRC (2018)
Joel Molina Reyes, Luis Hernández-Martínez
/Al Thin Films from the Dynamics of Conductive Filaments. Complex. 2017 (2017)
Alok Ranjan, Nagarajan Raghavan, Joel Molina Reyes, Sean J. O'Shea, Kalya Shubhakar, Kin Leong Pey
RRAM using conductive AFM. Microelectron. Reliab. 64 (2016)
Luis Antonio Carrillo-Martínez, Guillermo Espinosa Flores-Verdad, Joel Molina Reyes, Berni M. Perez
A smart transduction system with PVTA compensation for sensing applications. MWSCAS (2015)
Joel Molina Reyes, Rene Valderrama, Carlos Zuniga, Pedro Rosales, Wilfrido Calleja Arriaga, Alfonso Torres-Jácome, Francisco Javier de la Hidalga Wade, Edmundo A. Gutierrez-D
/W structures fabricated on glass at 300 °C. Microelectron. Reliab. 54 (12) (2014)
A. Erika Pondigo de los, Edmundo A. Gutierrez-D, Joel Molina Reyes, Fernando Guarin
Non-homogeneous space mechanical strain induces asymmetrical magneto-tunneling conductance in MOSFETs. ESSDERC (2014)
Carlos Ramón Báez Álvarez, Mónico Linares Aranda, Wilfrido Calleja Arriaga, Joel Molina Reyes
Effect of changing the material and device's properties on the performance of polysilicon-based MicroActuators. CCE (2013)
Joel Molina Reyes, Kuniyuki Kakushima, Parhat Ahmet, Kazuo Tsutsui, Nobuyuki Sugii, Takeo Hattori, Hiroshi Iwai
gated MOSFET structures after electrical stress. IEICE Electron. Express 4 (6) (2007)
Enrique Miranda, Joel Molina Reyes, Y. Kim, Hiroshi Iwai
gate dielectrics using progressive electrical stress. Microelectron. Reliab. 45 (9-11) (2005)