Nagarajan Raghavan

Publication Activity (10 Years)

Years Active: 2007-2023
Publications (10 Years): 45

Top Topics

Semiconductor Manufacturing

Trained Neural Networks

Gaussian Process

Top Venues

Microelectron. Reliab.

Publications

Tiang Teck Tan, Yu-Yun Wang, Joel Tan, Tian-Li Wu, Nagarajan Raghavan, Kin Leong Pey
A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices. IRPS (2023)
Sejun Yoon, Nagarajan Raghavan, Nguyen-Truong Le, Hyunseok Park
Investigating Knowledge Structure and Future Directions in IT-Based Business Methods Using Hierarchical Main Path Approach. IEEE Access 11 (2023)
J. Tan, J. H. Lim, Jae Hyun Kwon, Vinayak Bharat Naik, Nagarajan Raghavan, Kin Leong Pey
Backhopping-based STT-MRAM Poisson Spiking Neuron for Neuromorphic Computation. IRPS (2023)
Umesh Kizhakkinan, Pham Luu Trung Duong, Robert Laskowski, Guglielmo Vastola, David W. Rosen, Nagarajan Raghavan
Development of a surrogate model for high-fidelity laser powder-bed fusion using tensor train and gaussian process regression. J. Intell. Manuf. 34 (1) (2023)
Nagaraj Lakshmana Prabhu, Nagarajan Raghavan
Neuromorphic In-Memory RRAM NAND/NOR Circuit Performance Analysis in a CNN Training Framework on the Edge for Low Power IoT. IEEE Access 10 (2022)
Karkulali Pugalenthi, Hyunseok Park, Shaista Hussain, Nagarajan Raghavan
Remaining Useful Life Prediction of Lithium-Ion Batteries Using Neural Networks with Adaptive Bayesian Learning. Sensors 22 (10) (2022)
Cheryl Selvanayagam, Pham Luu Trung Duong, Brett Wilkerson, Nagarajan Raghavan
Global Optimization of Surface Warpage for Inverse Design of Ultra-Thin Electronic Packages Using Tensor Train Decomposition. IEEE Access 10 (2022)
Karkulali Pugalenthi, Hyunseok Park, Shaista Hussain, Nagarajan Raghavan
Predicting Lumen Degradation of Light Emitting Diodes Using Hybrid Particle Filter Trained Neural Networks. IEEE Access 9 (2021)
Dan Jiang, Weihua Lin, Nagarajan Raghavan
A Gaussian Mixture Model Clustering Ensemble Regressor for Semiconductor Manufacturing Final Test Yield Prediction. IEEE Access 9 (2021)
Nagaraj Lakshmana Prabhu, Nagarajan Raghavan
Computational Failure Analysis of In-Memory RRAM Architecture for Pattern Classification CNN Circuits. IEEE Access 9 (2021)
Sohee Kim, Sejun Yoon, Nagarajan Raghavan, Nguyen-Truong Le, Hyunseok Park
Developmental Trajectories in Blockchain Technology Using Patent-Based Knowledge Network Analysis. IEEE Access 9 (2021)
Dan Jiang, Weihua Lin, Nagarajan Raghavan
Semiconductor Manufacturing Final Test Yield Optimization and Wafer Acceptance Test Parameter Inverse Design Using Multi-Objective Optimization Algorithms. IEEE Access 9 (2021)
Cheryl Selvanayagam, Pham Luu Trung Duong, Brett Wilkerson, Nagarajan Raghavan
Inverse Design for Low Warpage Ultra-Thin Packages Using Constrained Particle Swarm Optimization. IEEE Access 9 (2021)
Sejun Yoon, Changbae Mun, Nagarajan Raghavan, Dongwook Hwang, Sohee Kim, Hyunseok Park
Hierarchical main path analysis to identify decompositional multi-knowledge trajectories. J. Knowl. Manag. 25 (2) (2021)
Karkulali Pugalenthi, Hyunseok Park, Shaista Hussain, Nagarajan Raghavan
Hybrid Particle Filter Trained Neural Network for Prognosis of Lithium-Ion Batteries. IEEE Access 9 (2021)
Lim Sze Li Harry, Pham Luu Trung Duong, Hyunseok Park, Nagarajan Raghavan
Bias Suppression Framework for Detrending Mean of Multi-Output Gaussian Process Regression in LED Remaining Storage Life Prognosis. IEEE Access 9 (2021)
Monika Tanwar, Nagarajan Raghavan, Sidra Khanam
Condition Based Maintenance Policy for Crankcase Lubricating Oil in Diesel Locomotives. IEEM (2021)
Laiqiang Luo, Kalya Shubhakar, Sen Mei, Nagarajan Raghavan, Fan Zhang, Danny Shum, Kin Leong Pey
Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device. IRPS (2020)
Alok Ranjan, Sean J. O'Shea, Michel Bosman, J. Molina, Nagarajan Raghavan, Kin Leong Pey
Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films. IRPS (2020)
Monika Tanwar, Nagarajan Raghavan
Lubricating Oil Remaining Useful Life Prediction Using Multi-Output Gaussian Process Regression. IEEE Access 8 (2020)
Karkulali Pugalenthi, Hyunseok Park, Nagarajan Raghavan
Piecewise Model-Based Online Prognosis of Lithium-Ion Batteries Using Particle Filters. IEEE Access 8 (2020)
Jia Hao Lim, Nagarajan Raghavan, Jae Hyun Kwon, Tae Young Lee, Robin Chao, Nyuk Leong Chung, Kazutaka Yamane, Naganivetha Thiyagarajah, Vinayak Bharat Naik, Kin Leong Pey
Origins and Signatures of Tail Bit Failures in Ultrathin MgO Based STT-MRAM. IRPS (2020)
Pham Luu Trung Duong, Shaista Hussain, Mark Hyunpong Jhon, Nagarajan Raghavan
Data Driven Prognosis of Fracture Dynamics Using Tensor Train and Gaussian Process Regression. IEEE Access 8 (2020)
Cheryl Selvanayagam, Pham Luu Trung Duong, Nagarajan Raghavan
Learning Localized Spatial Material Properties of Substrates in Ultra-Thin Packages Using Markov Chain Monte Carlo and Finite Element Analysis. IEEE Access 8 (2020)
Dan Jiang, Weihua Lin, Nagarajan Raghavan
A Novel Framework for Semiconductor Manufacturing Final Test Yield Classification Using Machine Learning Techniques. IEEE Access 8 (2020)
Fernando Leonel Aguirre, Andrea Padovani, Alok Ranjan, Nagarajan Raghavan, Nahuel Vega, Nahuel Muller, Sebastián Matías Pazos, Mario Debray, Joel Molina Reyes, Kin Leong Pey, Felix Palumbo
Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms. IRPS (2019)
Kin Leong Pey, Alok Ranjan, Nagarajan Raghavan, Kalya Shubhakar, Sean J. O'Shea
Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride - The Knowns and the Unknowns. IRPS (2019)
Jia Hao Lim, Nagarajan Raghavan, Vinayak Bharat Naik, Jae Hyun Kwon, Kazutaka Yamane, H. Yang, K. H. Lee, Kin Leong Pey
Correct Extrapolation Model for TDDB of STT-MRAM MgO Magnetic Tunnel Junctions. IRPS (2019)
Pham Luu Trung Duong, Hyunseok Park, Nagarajan Raghavan
Application of expectation maximization and Kalman smoothing for prognosis of lumen maintenance life for light emitting diodes. Microelectron. Reliab. 87 (2018)
Cheryl Selvanayagam, Rathin Mandal, Nagarajan Raghavan
Comparison of experimental, analytical and simulation methods to estimate substrate material properties for warpage reliability analysis. Microelectron. Reliab. (2018)
Alok Ranjan, Nagarajan Raghavan, Sean J. O'Shea, Sen Mei, Michel Bosman, Kalya Shubhakar, Kin Leong Pey
Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics. IRPS (2018)
Pham Luu Trung Duong, Xuechu Xu, Qing Yang, Nagarajan Raghavan
Gaussian process regression approach for robust design and yield enhancement of self-assembled nanostructures. Microelectron. Reliab. (2018)
Xuan Feng, Nagarajan Raghavan, Sen Mei, Shurong Dong, Kin Leong Pey, Hei Wong
Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress. Microelectron. Reliab. (2018)
Karkulali Pugalenthi, Nagarajan Raghavan
A holistic comparison of the different resampling algorithms for particle filter based prognosis using lithium ion batteries as a case study. Microelectron. Reliab. 91 (2018)
Jia Hao Lim, Nagarajan Raghavan, Sen Mei, Vinayak Bharat Naik, Jae Hyun Kwon, S. M. Noh, B. Liu, E. H. Toh, Nyuk Leong Chung, Robin Chao, K. H. Lee, Kin Leong Pey
Area and pulsewidth dependence of bipolar TDDB in MgO magnetic tunnel junction. IRPS (2018)
Pham Luu Trung Duong, Hyunseok Park, Nagarajan Raghavan
Application of multi-output Gaussian process regression for remaining useful life prediction of light emitting diodes. Microelectron. Reliab. (2018)
Pham Luu Trung Duong, Nagarajan Raghavan
Heuristic Kalman optimized particle filter for remaining useful life prediction of lithium-ion battery. Microelectron. Reliab. 81 (2018)
Chinedu I. Ossai, Xuechu Xu, Qing Yang, Nagarajan Raghavan
Uncertainty quantification in nanowire growth modeling - A precursor to quality semiconductor nanomanufacturing. Microelectron. Reliab. (2017)
Pham Luu Trung Duong, Nagarajan Raghavan
Uncertainty quantification in prognostics: A data driven polynomial chaos approach. ICPHM (2017)
Pham Luu Trung Duong, Nagarajan Raghavan
A metaheuristic approach to remaining useful life estimation of systems subject to multiple degradation mechanisms. ICPHM (2017)
Pham Luu Trung Duong, Trong Toan Tran, Nagarajan Raghavan
Application of multiplicative dimensional reduction method for uncertainty quantification and sensitivity analysis of MEMS electrostatic actuators. Microelectron. Reliab. (2017)
Kalya Shubhakar, Sen Mei, Michel Bosman, Nagarajan Raghavan, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey
-based MIM stacks: Computational and physical insight. Microelectron. Reliab. 64 (2016)
Alok Ranjan, Nagarajan Raghavan, Joel Molina Reyes, Sean J. O'Shea, Kalya Shubhakar, Kin Leong Pey
RRAM using conductive AFM. Microelectron. Reliab. 64 (2016)
Nagarajan Raghavan
Application of the defect clustering model for forming, SET and RESET statistics in RRAM devices. Microelectron. Reliab. 64 (2016)
Sen Mei, Michel Bosman, Nagarajan Raghavan, Xing Wu, Kin Leong Pey
defect size in Ni/dielectric/Si RRAM devices. Microelectron. Reliab. 61 (2016)
Kalya Shubhakar, Michel Bosman, O. A. Neucheva, Y. C. Loke, Nagarajan Raghavan, R. Thamankar, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey
dielectric stacks for failure analysis. Microelectron. Reliab. 55 (9-10) (2015)
Nagarajan Raghavan, Daniel D. Frey
Particle filter approach to lifetime prediction for microelectronic devices and systems with multiple failure mechanisms. Microelectron. Reliab. 55 (9-10) (2015)
Nagarajan Raghavan, Daniel D. Frey, Michel Bosman, Kin Leong Pey
Monte Carlo model of reset stochastics and failure rate estimation of read disturb mechanism in HfOx RRAM. IRPS (2015)
Nagarajan Raghavan, Michel Bosman, Kin Leong Pey
Spectroscopy of SILC trap locations and spatial correlation study of percolation path in the high-κ and interfacial layer. IRPS (2015)
Nagarajan Raghavan, Daniel D. Frey
Remaining useful life estimation for systems subject to multiple degradation mechanisms. ICPHM (2015)
Nagarajan Raghavan, Daniel D. Frey, Michel Bosman, Kin Leong Pey
Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach. Microelectron. Reliab. 55 (9-10) (2015)
Nagarajan Raghavan, Michel Bosman, Kin Leong Pey
Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory. Microelectron. Reliab. 55 (9-10) (2015)
Nagarajan Raghavan, Daniel D. Frey, Kin Leong Pey
Prognostic methodology for remaining useful life estimation of retention loss in nanoscale resistive switching memory. Microelectron. Reliab. 54 (9-10) (2014)
Nagarajan Raghavan, Michel Bosman, Daniel D. Frey, Kin Leong Pey
Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices. Microelectron. Reliab. 54 (9-10) (2014)
Nagarajan Raghavan, Michel Bosman, Kin Leong Pey
Assessment of read disturb immunity in conducting bridge memory devices - A thermodynamic perspective. Microelectron. Reliab. 54 (9-10) (2014)
Nagarajan Raghavan, Kin Leong Pey, Kalya Shubhakar
High-κ dielectric breakdown in nanoscale logic devices - Scientific insight and technology impact. Microelectron. Reliab. 54 (5) (2014)
Kalya Shubhakar, Nagarajan Raghavan, Sunil Singh Kushvaha, Michel Bosman, Zhongrui Wang, Sean J. O'Shea, Kin Leong Pey
interfacial layer. Microelectron. Reliab. 54 (9-10) (2014)
Nagarajan Raghavan
Performance and reliability trade-offs for high-κ RRAM. Microelectron. Reliab. 54 (9-10) (2014)
Cher Ming Tan, Nagarajan Raghavan
Reply to comments on "A framework to practical predictive maintenance modeling for multi-state systems". Reliab. Eng. Syst. Saf. 94 (3) (2009)
Cher Ming Tan, Nagarajan Raghavan
A framework to practical predictive maintenance modeling for multi-state systems. Reliab. Eng. Syst. Saf. 93 (8) (2008)
Cher Ming Tan, Nagarajan Raghavan
An approach to statistical analysis of gate oxide breakdown mechanisms. Microelectron. Reliab. 47 (9-11) (2007)