Felix Palumbo

Publication Activity (10 Years)

Years Active: 2005-2021
Publications (10 Years): 9

Top Topics

Pattern Recognition

High Reliability

Experimental Study

Thermal Conductivity

Top Venues

Microelectron. Reliab.

Publications

Fernando L. Aguirre, Sebastián Matías Pazos, Felix Palumbo, N. Gomez, Enrique Miranda, Jordi Suñé
Line Resistance Impact in Memristor-based Multi Layer Perceptron for Pattern Recognition. LASCAS (2021)
Fernando Leonel Aguirre, Sebastián Matías Pazos, Felix Palumbo, Jordi Suñé, Enrique Miranda
Application of the Quasi-Static Memdiode Model in Cross-Point Arrays for Large Dataset Pattern Recognition. IEEE Access 8 (2020)
Fernando Leonel Aguirre, Andrea Padovani, Alok Ranjan, Nagarajan Raghavan, Nahuel Vega, Nahuel Muller, Sebastián Matías Pazos, Mario Debray, Joel Molina Reyes, Kin Leong Pey, Felix Palumbo
Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms. IRPS (2019)
Sebastián Matías Pazos, Fernando L. Aguirre, Felix Palumbo, Fernando Silveira
Performance-reliability trade-offs in short range RF power amplifier design. Microelectron. Reliab. (2018)
A. Fontana, Sebastián Matías Pazos, Fernando L. Aguirre, Felix Palumbo, Nahuel Vega, N. A. Muller, E. de la Fourniere, Mario Debray
Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp. SBCCI (2018)
Fernando L. Aguirre, Sebastián Matías Pazos, Felix Palumbo, Sivan Fadida, Roy Winter, Moshe Eizenberg
Impact of forming gas annealing on the degradation dynamics of Ge-based MOS stacks. IRPS (2018)
Xianhu Liang, Bin Yuan, Yuanyuan Shi, Fei Hui, Xu Jing, Mario Lanza, Felix Palumbo
Enhanced reliability of hexagonal boron nitride dielectric stacks due to high thermal conductivity. IRPS (2018)
Felix Palumbo, Salvatore Lombardo, Moshe Eizenberg
Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks. Microelectron. Reliab. 56 (2016)
Felix Palumbo, Moshe Eizenberg, Salvatore Lombardo
General features of progressive breakdown in gate oxides: A compact model. IRPS (2015)
Santiago Sondon, Alfredo Falcon, Pablo Sergio Mandolesi, Pedro Julián, Nahuel Vega, Francisco Nesprias, Jorge Davidson, Felix Palumbo, Mario Debray
Diagnose of radiation induced single event effects in a PLL using a heavy ion microbeam. LATW (2013)
Santiago Sondon, Pablo Sergio Mandolesi, Favio R. Masson, Pedro Julián, Felix Palumbo
A dual core low power microcontroller with openMSP430 architecture for high reliability lockstep applications using a 180 nm high voltage technology node. LASCAS (2013)
Sebania Libertino, Domenico Corso, G. Murè, A. Marino, Felix Palumbo, Fabio Principato, G. Cannella, T. Schillaci, S. Giarusso, F. Celi, Michael Lisiansky, Yakov Roizin, Salvatore Lombardo
Radiation effects in nitride read-only memories. Microelectron. Reliab. 50 (9-11) (2010)
Santiago Sondon, Pablo Sergio Mandolesi, Pedro Julián, Felix Palumbo, Martin Alurralde, Alberto Filevich
Radiation damage characterization of digital integrated circuits. LATW (2009)
R. Pagano, Salvatore Lombardo, Felix Palumbo, Paul Kirsch, S. A. Krishnan, Chadwin D. Young, Rino Choi, Gennadi Bersuker, James H. Stathis
A novel approach to characterization of progressive breakdown in high-k/metal gate stacks. Microelectron. Reliab. 48 (11-12) (2008)
Felix Palumbo, G. Condorelli, Salvatore Lombardo, Kin Leong Pey, C. H. Tung, L. J. Tang
Structure of the oxide damage under progressive breakdown. Microelectron. Reliab. 45 (5-6) (2005)