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Enhanced reliability of hexagonal boron nitride dielectric stacks due to high thermal conductivity.
Xianhu Liang
Bin Yuan
Yuanyuan Shi
Fei Hui
Xu Jing
Mario Lanza
Felix Palumbo
Published in:
IRPS (2018)
Keyphrases
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thermal conductivity
gate insulator
high reliability
computer vision
artificial intelligence
image processing
wavelet transform
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