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Experts
- Shun'ichiro Ohmi
- George J. Papaioannou
- Xavier Aymerich
- P. T. Lai
- Montserrat Nafría
- Gianluca Piazza
- Sohya Kudoh
- Shinichi Takagi
- Mario Lanza
- James H. Stathis
- Min Liao
- W. S. Lau
- Haiwen Liu
- Hei Wong
- Hongliang Tian
- Hiroshi Ishiwara
- Huiseong Han
- Matroni Koutsoureli
- Dae-Hee Han
- Marc Porti
- E. Papandreou
- Augusto Tazzoli
- Marko Radosavljevic
- D. Radisic
- James R. Shealy
- Dae-Young Choi
- S. T. Che
- Jacob Levin
- Shraddha Thakre
- Weichun Luo
- Peter Buchmann
- Andrey Miroshnichenko
- Y. P. Li
- Thomas Toifl
- M. Wang
- Teresa Oh
- Gerald Lucovsky
- Mojtaba Javaheri
- Pascal Simon
Venues
- Microelectron. Reliab.
- Sensors
- IRPS
- IET Circuits Devices Syst.
- IEICE Trans. Electron.
- Microelectron. J.
- NEMS
- DRC
- IEEE Access
- IEICE Electron. Express
- IBM J. Res. Dev.
- IEEE SENSORS
- VLSI Design
- ESSDERC
- IEEE Trans. Instrum. Meas.
- IEEE Trans. Circuits Syst. II Express Briefs
- ICICDT
- OECC/PSC
- IAS
- IEEE Trans. Ind. Electron.
- CICC
- SENSORS
- Sci. China Inf. Sci.
- CARS
- J. Electronic Imaging
- J. Imaging
- ICAIT
- Comput. Electron. Agric.
- COOL Chips
- IET Comput. Digit. Tech.
- OFC
- MDA
- iNIS
- IJCNN
- Sensors, Cameras, and Systems for Industrial and Scientific Applications
- I2MTC
- J. Low Power Electron.
- DeSE
- ICHIT (2)
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