A. Kerber

Publication Activity (10 Years)

Years Active: 2006-2018
Publications (10 Years): 3

Top Topics

Electronic Devices

Top Venues

Microelectron. Reliab.

Publications

Peter C. Paliwoda, Zakariae Chbili, A. Kerber, D. Singh, Durga Misra
Ambient temperature and layout impact on self-heating characterization in FinFET devices. IRPS (2018)
D. Singh, O. D. Restrepo, P. P. Manik, N. Rao Mavilla, H. Zhang, Peter C. Paliwoda, S. Pinkett, Y. Deng, E. Cruz Silva, J. B. Johnson, M. Bajaj, S. Furkay, Z. Chbili, A. Kerber, C. Christiansen, S. Narasimha, E. Maciejewski, S. Samavedam, C.-H. Lin
Bottom-up methodology for predictive simulations of self-heating in aggressively scaled process technologies. IRPS (2018)
A. Kerber
Device to circuit reliability correlations for metal gate/high-k transistors in scaled CMOS technologies. Microelectron. Reliab. 64 (2016)
P. Srinivasan, J. Fronheiser, S. Siddiqui, A. Kerber, L. F. Edge, R. G. Southwick, Eduard Cartier
NBTI in Si0.5Ge0.5 RMG gate stacks - Effect of high-k nitridation. IRPS (2015)
A. Kerber
Impact of RTN on stochastic BTI degradation in scaled metal gate/high-k CMOS technologies. IRPS (2015)
A. Kerber, Luigi Pantisano, Anabela Veloso, Guido Groeseneken, Martin Kerber
Reliability screening of high-k dielectrics based on voltage ramp stress. Microelectron. Reliab. 47 (4-5) (2007)
T. Pompl, A. Kerber, M. Röhner, Martin Kerber
Gate voltage and oxide thickness dependence of progressive wear-out of ultra-thin gate oxides. Microelectron. Reliab. 46 (9-11) (2006)