T. Pompl

Publication Activity (10 Years)

Years Active: 2001-2006
Publications (10 Years): 0

Publications

T. Pompl, A. Kerber, M. Röhner, Martin Kerber
Gate voltage and oxide thickness dependence of progressive wear-out of ultra-thin gate oxides. Microelectron. Reliab. 46 (9-11) (2006)
G. Innertsberger, T. Pompl, Martin Kerber
The influence of p-polysilicon gate doping on the dielectric breakdown of PMOS devices. Microelectron. Reliab. 41 (7) (2001)
T. Pompl, C. Engel, H. Wurzer, Martin Kerber
Soft breakdown and hard breakdown in ultra-thin oxides. Microelectron. Reliab. 41 (4) (2001)