Martin Kerber

Publication Activity (10 Years)

Years Active: 2001-2016
Publications (10 Years): 1

Top Topics

Technical Aspects

Electronic Devices

Top Venues

Microelectron. Reliab.

Publications

Frank Hille, Roman Roth, Carsten Schäffer, Holger Schulze, Nicolas Heuck, Daniel Bolowski, Karsten Guth, Alexander Ciliox, Karina Rott, Frank Umbach, Martin Kerber
Reliability aspects of copper metallization and interconnect technology for power devices. Microelectron. Reliab. 64 (2016)
Rainer Duschl, Martin Kerber, A. Avellan, S. Jakschik, Uwe Schroeder, S. Kudelka
Reliability aspects of Hf-based capacitors: Breakdown and trapping effects. Microelectron. Reliab. 47 (4-5) (2007)
A. Kerber, Luigi Pantisano, Anabela Veloso, Guido Groeseneken, Martin Kerber
Reliability screening of high-k dielectrics based on voltage ramp stress. Microelectron. Reliab. 47 (4-5) (2007)
T. Pompl, A. Kerber, M. Röhner, Martin Kerber
Gate voltage and oxide thickness dependence of progressive wear-out of ultra-thin gate oxides. Microelectron. Reliab. 46 (9-11) (2006)
Gunnar Diestel, Andreas Martin, Martin Kerber, Alfred Schlemm, Horst Erlenmaier, Bernhard Murr, Andreas Preussger
Quality assessment of thin oxides using constant and ramped stress measurements. Microelectron. Reliab. 41 (7) (2001)
Udo Schwalke, Martin Pölzl, Thomas Sekinger, Martin Kerber
Ultra-thick gate oxides: charge generation and its impact on reliability. Microelectron. Reliab. 41 (7) (2001)
G. Innertsberger, T. Pompl, Martin Kerber
The influence of p-polysilicon gate doping on the dielectric breakdown of PMOS devices. Microelectron. Reliab. 41 (7) (2001)
T. Pompl, C. Engel, H. Wurzer, Martin Kerber
Soft breakdown and hard breakdown in ultra-thin oxides. Microelectron. Reliab. 41 (4) (2001)