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Reliability aspects of Hf-based capacitors: Breakdown and trapping effects.
Rainer Duschl
Martin Kerber
A. Avellan
S. Jakschik
Uwe Schroeder
S. Kudelka
Published in:
Microelectron. Reliab. (2007)
Keyphrases
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learning environment
high frequency
mahalanobis distance
information retrieval
integrated circuit
data sets
search engine
case study
computational complexity
image compression
reliability analysis