Rainer Duschl

Publication Activity (10 Years)

Years Active: 2001-2017
Publications (10 Years): 1

Top Topics

Influencing Factors

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Top Venues

Microelectron. Reliab.

Publications

Rainer Duschl, Armin H. Fischer, Achim Gratz, Robert Wiesner
Static and dynamic hot carrier accelerated TDDB: Influencing factors and impact on product lifetime. Microelectron. Reliab. (2017)
Rainer Duschl, Martin Kerber, A. Avellan, S. Jakschik, Uwe Schroeder, S. Kudelka
Reliability aspects of Hf-based capacitors: Breakdown and trapping effects. Microelectron. Reliab. 47 (4-5) (2007)
Rainer Duschl, Rolf-Peter Vollertsen
Is the power-law model applicable beyond the direct tunneling regime? Microelectron. Reliab. 45 (12) (2005)
Gerald Neumann, J. Touzel, Rainer Duschl
Localization and physical analysis of dielectric weaknesses for state-of-the-art deep trench based DRAM products. Microelectron. Reliab. 45 (9-11) (2005)
Werner Prost, Uwe Auer, Franz-Josef Tegude, Christian Pacha, Karl Goser, Rainer Duschl, K. Eberl, O. Schmidt
Tunnelling Diode Technology. ISMVL (2001)