Rolf-Peter Vollertsen

Publication Activity (10 Years)

Years Active: 2002-2016
Publications (10 Years): 1

Top Topics

Manufacturing Process

Top Venues

Microelectron. Reliab.

Publications

Andreas Martin, Rolf-Peter Vollertsen, A. Mitchell, M. Traving, D. Beckmeier, H. Nielen
Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process. Microelectron. Reliab. 64 (2016)
Rolf-Peter Vollertsen, Georg Georgakos, K. Kölpin, C. Olk
A fWLR test structure and method for device reliability monitoring using product relevant circuits. IRPS (2015)
Rainer Duschl, Rolf-Peter Vollertsen
Is the power-law model applicable beyond the direct tunneling regime? Microelectron. Reliab. 45 (12) (2005)
Rolf-Peter Vollertsen, Enrique Miranda
The TDDB power-law model - Physics and experimental evidences. Microelectron. Reliab. 45 (12) (2005)
Andreas Martin, Rolf-Peter Vollertsen
An introduction to fast wafer level reliability monitoring for integrated circuit mass production. Microelectron. Reliab. 44 (8) (2004)
Rolf-Peter Vollertsen, E. Y. Wu
Voltage acceleration and t63.2 of 1.6-10 nm gate oxides. Microelectron. Reliab. 44 (6) (2004)
Rolf-Peter Vollertsen
Fast wafer level reliability: methods and experiences. Microelectron. Reliab. 44 (8) (2004)
Rolf-Peter Vollertsen
Thin dielectric reliability assessment for DRAM technology with deep trench storage node. Microelectron. Reliab. 43 (6) (2003)
Fen Chen, Rolf-Peter Vollertsen, Baozhen Li, Dave Harmon, Wing L. Lai
and nitride-oxide dielectrics. Microelectron. Reliab. 42 (3) (2002)