A fWLR test structure and method for device reliability monitoring using product relevant circuits.
Rolf-Peter VollertsenGeorg GeorgakosK. KölpinC. OlkPublished in: IRPS (2015)
Keyphrases
- detection method
- tree structure
- experimental evaluation
- cost function
- statistical significance
- high precision
- test data
- support vector machine
- computational cost
- pairwise
- preprocessing
- similarity measure
- dynamic programming
- significant improvement
- denoising
- optimization algorithm
- multiscale
- bayesian networks
- face recognition
- learning algorithm