Baozhen Li

Publication Activity (10 Years)

Years Active: 2002-2023
Publications (10 Years): 9

Top Topics

Nearest Neighbour

Technical Solutions

Top Venues

Comput. Intell. Neurosci.

Microelectron. Reliab.

Publications

Guangyuan Zhao, Baozhen Li, Xu Huang
Tomato leaf disease identification based on attention and inception mechanism. AIPR (2023)
Ernest Y. Wu, Ron Bolam, Baozhen Li, Tian Shen, Barry P. Linder, Griselda Bonilla, Miaomiao Wang, Dechao Guo
A Flexible and Inherently Self-Consistent Methodology for MOL/BEOL/MIMCAP TDDB Applications with Excessive Variability-Induced Degradation. IRPS (2022)
Ernest Y. Wu, Baozhen Li
Quantum Mechanical Connection of Schottky Emission Process and Its implications on Breakdown Methodology and Conduction Modeling for BEOL Low-k Dielectrics. IRPS (2022)
Baozhen Li, Lina Zhang
Design and Research of Mathematics Teaching Intelligent Classroom Based on PCA-NN Algorithm. Comput. Intell. Neurosci. 2021 (2021)
Andrew Kim, Ernest Y. Wu, Baozhen Li, Barry P. Linder
Transformation of Ramped Current Stress VBDto Constant Voltage Stress TDDB TBD. IRPS (2019)
Ernest Y. Wu, Baozhen Li, James H. Stathis, Andrew Kim
Comprehensive Methodology for Multiple Spots Competing Progressive Breakdown for BEOL/FEOL Applications. IRPS (2019)
Baozhen Li, Andrew Kim, Paul McLaughlin, Barry P. Linder, Cathryn Christiansen
Electromigration characteristics of power grid like structures. IRPS (2018)
Andrew Kim, Baozhen Li, Barry P. Linder
Transient self-heating modeling and simulations of back-end-of-line interconnects. IRPS (2018)
Ernest Y. Wu, Andrew Kim, Baozhen Li, James H. Stathis
Elapsed-time statistics of successive breakdown in the presence of variability for dielectric breakdown in BEOL/MOL/FEOL applications. IRPS (2018)
Baozhen Li, K. Paul Muller, James D. Warnock, Leon J. Sigal, Dinesh Badami
A case study of electromigration reliability: From design point to system operations. IRPS (2015)
Ernest Y. Wu, James H. Stathis, Baozhen Li, Barry P. Linder, Kai Zhao, Griselda Bonilla
A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL). IRPS (2015)
Baozhen Li, Cathryn Christiansen, Dinesh Badami, Chih-Chao Yang
Electromigration challenges for advanced on-chip Cu interconnects. Microelectron. Reliab. 54 (4) (2014)
Shengnan Xu, Baozhen Li, Yanhua Shao
Neural Network Approach Based on Agent to Predict Stock Performance. CSSE (1) (2008)
Baozhen Li, Emmanuel Yashchin, Cathryn Christiansen, Jason Gill, Ronald Filippi, Timothy D. Sullivan
Application of three-parameter lognormal distribution in EM data analysis. Microelectron. Reliab. 46 (12) (2006)
Baozhen Li, Nana Li, Xianfeng Liu
Transformation & Countermeasures on Business Operation Models in Uncertain Environment. ICEB (2004)
Baozhen Li, Timothy D. Sullivan, Tom C. Lee, Dinesh Badami
Reliability challenges for copper interconnects. Microelectron. Reliab. 44 (3) (2004)
Fen Chen, Rolf-Peter Vollertsen, Baozhen Li, Dave Harmon, Wing L. Lai
and nitride-oxide dielectrics. Microelectron. Reliab. 42 (3) (2002)