Cathryn Christiansen

Publication Activity (10 Years)

Years Active: 2006-2018
Publications (10 Years): 3

Top Topics

Hough Transform

Evaluation Process

Top Venues

Microelectron. Reliab.

Publications

Tian Shen, Kong Boon Yeap, Sean P. Ogden, Cathryn Christiansen, Patrick Justison
New insight on TDDB area scaling methodology of non-Poisson systems. IRPS (2018)
Baozhen Li, Andrew Kim, Paul McLaughlin, Barry P. Linder, Cathryn Christiansen
Electromigration characteristics of power grid like structures. IRPS (2018)
Seungman Choi, Cathryn Christiansen, Linjun Cao, James Zhang, Ronald Filippi, Tian Shen, Kong Boon Yeap, Sean P. Ogden, Haojun Zhang, Bianzhu Fu, Patrick Justison
Effect of metal line width on electromigration of BEOL Cu interconnects. IRPS (2018)
Fen Chen, Erik McCullen, Cathryn Christiansen, Michael A. Shinosky, Roger Dufresne, Prakash Periasamy, Rick Kontra, Carole Graas, Gary StOnge
Diagnostic electromigration reliability evaluation with a local sensing structure. IRPS (2015)
Baozhen Li, Cathryn Christiansen, Dinesh Badami, Chih-Chao Yang
Electromigration challenges for advanced on-chip Cu interconnects. Microelectron. Reliab. 54 (4) (2014)
Baozhen Li, Emmanuel Yashchin, Cathryn Christiansen, Jason Gill, Ronald Filippi, Timothy D. Sullivan
Application of three-parameter lognormal distribution in EM data analysis. Microelectron. Reliab. 46 (12) (2006)