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Effect of metal line width on electromigration of BEOL Cu interconnects.

Seungman ChoiCathryn ChristiansenLinjun CaoJames ZhangRonald FilippiTian ShenKong Boon YeapSean P. OgdenHaojun ZhangBianzhu FuPatrick Justison
Published in: IRPS (2018)
Keyphrases
  • line segments
  • input output
  • cross section
  • computer vision
  • similarity measure
  • mobile robot
  • data sets
  • social networks
  • multi agent systems
  • hough transform
  • line detection