Kong Boon Yeap

Publication Activity (10 Years)

Years Active: 2015-2018
Publications (10 Years): 3

Top Topics

Hough Transform

Decision Process

Top Venues

Microelectron. Reliab.

Publications

Tian Shen, Kong Boon Yeap, Sean P. Ogden, Cathryn Christiansen, Patrick Justison
New insight on TDDB area scaling methodology of non-Poisson systems. IRPS (2018)
Seungman Choi, Cathryn Christiansen, Linjun Cao, James Zhang, Ronald Filippi, Tian Shen, Kong Boon Yeap, Sean P. Ogden, Haojun Zhang, Bianzhu Fu, Patrick Justison
Effect of metal line width on electromigration of BEOL Cu interconnects. IRPS (2018)
Sean P. Ogden, Yueming Xu, Kong Boon Yeap, Tian Shen, Toh-Ming Lu, Joel L. Plawsky
Charge transport model to predict dielectric breakdown as a function of voltage, temperature, and thickness. Microelectron. Reliab. 91 (2018)
Wenyi Zhang, M. C. Silvestre, A. Selvam, E. Ramanathan, C. Ordonio, J. Schaller, Tian Shen, Kong Boon Yeap, C. Capasso, Patrick Justison, J. H. Lee
An investigation of process dependence of porous IMD TDDB. IRPS (2015)
Kong Boon Yeap, Tian Shen, Galor Wenyi Zhang, Sing Fui Yap, Brian Holt, Arfa Gondal, Seungman Choi, San Leong Liew, Walter Yao, Patrick Justison
Impact of electrode surface modulation on time-dependent dielectric breakdown. IRPS (2015)
Tian Shen, Wenyi Zhang, Kong Boon Yeap, Jing Tan, Walter Yao, Patrick Justison
An investigation of dielectric thickness scaling on BEOL TDDB. IRPS (2015)