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Charge transport model to predict dielectric breakdown as a function of voltage, temperature, and thickness.

Sean P. OgdenYueming XuKong Boon YeapTian ShenToh-Ming LuJoel L. Plawsky
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • parameter estimation
  • experimental data
  • objective function
  • computational model
  • formal model
  • probabilistic model
  • em algorithm
  • mathematical model
  • linear model
  • data sets
  • statistical model
  • electrical properties