Michael A. Shinosky

Publication Activity (10 Years)

Years Active: 2008-2015
Publications (10 Years): 0

Top Topics

Evaluation Process

Hierarchical Structure

Data Generation

Leakage Current

Top Venues

Microelectron. Reliab.

Publications

Fen Chen, Carole Graas, Michael A. Shinosky, Chad Burke, Kai D. Feng, Craig Bocash, Ramachandran Muralidhar
A method for rapid screening of various low-k TDDB models. IRPS (2015)
Fen Chen, Carole Graas, Michael A. Shinosky, Kai Zhao, Shreesh Narasimha, Xiao Hu Liu, Chunyan Tian
Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges. Microelectron. Reliab. 55 (12) (2015)
Fen Chen, Erik McCullen, Cathryn Christiansen, Michael A. Shinosky, Roger Dufresne, Prakash Periasamy, Rick Kontra, Carole Graas, Gary StOnge
Diagnostic electromigration reliability evaluation with a local sensing structure. IRPS (2015)
Fen Chen, Michael A. Shinosky
Electron fluence driven, Cu catalyzed, interface breakdown mechanism for BEOL low-k time dependent dielectric breakdown. Microelectron. Reliab. 54 (3) (2014)
Fen Chen, O. Bravo, Dave Harmon, Michael A. Shinosky, J. Aitken
Cu/low-k dielectric TDDB reliability issues for advanced CMOS technologies. Microelectron. Reliab. 48 (8-9) (2008)