O. Bravo

Publication Activity (10 Years)

Years Active: 2008-2008
Publications (10 Years): 0

Publications

Fen Chen, O. Bravo, Dave Harmon, Michael A. Shinosky, J. Aitken
Cu/low-k dielectric TDDB reliability issues for advanced CMOS technologies. Microelectron. Reliab. 48 (8-9) (2008)