Shreesh Narasimha

Publication Activity (10 Years)

Years Active: 2003-2015
Publications (10 Years): 2

Top Topics

Metal Oxide Semiconductor

Integrated Circuit

Top Venues

IBM J. Res. Dev.

Microelectron. Reliab.

Publications

G. Freeman, P. Chang, E. R. Engbrecht, K. J. Giewont, D. F. Hilscher, M. Lagus, T. J. McArdle, B. Morgenfeld, Shreesh Narasimha, James P. Norum, K. A. Nummy, Paul C. Parries, G. Wang, Jonathan K. Winslow, Paul D. Agnello, Rajeev Malik
Performance-optimized gate-first 22-nm SOI technology with embedded DRAM. IBM J. Res. Dev. 59 (1) (2015)
Fen Chen, Carole Graas, Michael A. Shinosky, Kai Zhao, Shreesh Narasimha, Xiao Hu Liu, Chunyan Tian
Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges. Microelectron. Reliab. 55 (12) (2015)
Subramanian S. Iyer, Greg G. Freeman, Colin Brodsky, Anthony I. Chou, Dan Corliss, Sameer H. Jain, Naftali E. Lustig, Vincent McGahay, Shreesh Narasimha, James P. Norum, Karen A. Nummy, Paul C. Parries, Sujatha Sankaran, Chris D. Sheraw, Pushkara Rao Varanasi, Geng Wang, Mary E. Weybright, Xiaojun Yu, Emmanuel Crabbe, Paul D. Agnello
45-nm silicon-on-insulator CMOS technology integrating embedded DRAM for high-performance server and ASIC applications. IBM J. Res. Dev. 55 (3) (2011)
Daniel J. Poindexter, Scott R. Stiffler, Philip T. Wu, Paul D. Agnello, Thomas Ivers, Shreesh Narasimha, Thomas B. Faure, Jed H. Rankin, David A. Grosch, Marc D. Knox, Daniel C. Edelstein, Mukesh Khare, Gary B. Bronner, Hyun-Jang Nam, Shahid A. Butt
Optimization of silicon technology for the IBM System z9. IBM J. Res. Dev. 51 (1/2) (2007)
Jean-Olivier Plouchart, Noah Zamdmer, Jonghae Kim, Melanie Sherony, Yue Tan, Asit Ray, Mohamed Talbi, Lawrence F. Wagner, Kun Wu, Naftali E. Lustig, Shreesh Narasimha, Patricia O'Neil, Nghia Phan, Michael Rohn, James Strom, David M. Friend, Stephen V. Kosonocky, Daniel R. Knebel, Suhwan Kim, Keith A. Jenkins, Michel M. Rivier
Application of an SOI 0.12-µm CMOS technology to SoCs with low-power and high-frequency circuits. IBM J. Res. Dev. 47 (5-6) (2003)