Dinesh Badami

Publication Activity (10 Years)

Years Active: 2004-2015
Publications (10 Years): 1

Top Topics

Power Dissipation

Top Venues

Microelectron. Reliab.

Publications

Baozhen Li, K. Paul Muller, James D. Warnock, Leon J. Sigal, Dinesh Badami
A case study of electromigration reliability: From design point to system operations. IRPS (2015)
Baozhen Li, Cathryn Christiansen, Dinesh Badami, Chih-Chao Yang
Electromigration challenges for advanced on-chip Cu interconnects. Microelectron. Reliab. 54 (4) (2014)
Baozhen Li, Timothy D. Sullivan, Tom C. Lee, Dinesh Badami
Reliability challenges for copper interconnects. Microelectron. Reliab. 44 (3) (2004)