K. Paul Muller

Publication Activity (10 Years)

Years Active: 1999-2015
Publications (10 Years): 3

Top Topics

Industry Standard

Ibm Zenterprise

Top Venues

Publications

Baozhen Li, K. Paul Muller, James D. Warnock, Leon J. Sigal, Dinesh Badami
A case study of electromigration reliability: From design point to system operations. IRPS (2015)
Phil Oldiges, Kenneth P. Rodbell, Michael S. Gordon, John G. Massey, Kevin Stawiasz, Conal E. Murray, Henry H. K. Tang, K. Kim, K. Paul Muller
SOI FinFET soft error upset susceptibility and analysis. IRPS (2015)
Pong-Fei Lu, Keith A. Jenkins, K. Paul Muller, Ralf Schaufler
Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology. IRPS (2015)
Chen-Yong Cher, K. Paul Muller, Ruud A. Haring, David L. Satterfield, Thomas E. Musta, Thomas Gooding, Kristan D. Davis, Marc Boris Dombrowa, Gerard V. Kopcsay, Robert M. Senger, Yutaka Sugawara, Krishnan Sugavanam
Soft Error Resiliency Characterization on IBM BlueGene/Q Processor. ASP-DAC (2014)
Chen-Yong Cher, Meeta Sharma Gupta, Pradip Bose, K. Paul Muller
Understanding Soft Error Resiliency of Blue Gene/Q Compute Chip through Hardware Proton Irradiation and Software Fault Injection. SC (2014)
Chen-Yong Cher, K. Paul Muller, Ruud A. Haring, David L. Satterfield, Thomas E. Musta, Thomas Gooding, Kristan D. Davis, Marc Boris Dombrowa, Gerard V. Kopcsay, Robert M. Senger, Yutaka Sugawara, Krishnan Sugavanam
Soft error resiliency characterization and improvement on IBM BlueGene/Q processor using accelerated proton irradiation. ITC (2014)
James D. Warnock, Leon J. Sigal, Dieter F. Wendel, K. Paul Muller, Joshua Friedrich, Victor V. Zyuban, Ethan H. Cannon, A. J. KleinOsowski
local clocking and clocked storage elements. ISSCC (2010)
Michael Armacost, Peter D. Hoh, Richard Wise, Wendy Yan, Jeffrey J. Brown, John H. Keller, George A. Kaplita, Scott D. Halle, K. Paul Muller, Munir D. Naeem, Senthil Srinivasan, Hung Y. Ng, Martin Gutsche, Alois Gutmann, Bruno Spuler
Plasma-etching processes for ULSI semiconductor circuits. IBM J. Res. Dev. 43 (1) (1999)