Ethan H. Cannon

Publication Activity (10 Years)

Years Active: 2008-2018
Publications (10 Years): 4

Top Topics

Technical Issues

Adaptive Systems

Technical Solutions

Metal Oxide Semiconductor

Top Venues

Microelectron. Reliab.

Publications

Devyani Patra, Jiayang Zhang, Runsheng Wang, Mehdi Katoozi, Ethan H. Cannon, Ru Huang, Yu Cao
Compact modeling and simulation of accelerated circuit aging. CICC (2018)
Devyani Patra, Ahmed Kamal Reza, Mehdi Katoozi, Ethan H. Cannon, Kaushik Roy, Yu Cao
Accelerated BTI degradation under stochastic TDDB effect. IRPS (2018)
Devyani Patra, Ahmed Kamal Reza, Mohammad Khaled Hassan, Mehdi Katoozi, Ethan H. Cannon, Kaushik Roy, Yu Cao
Adaptive accelerated aging for 28 nm HKMG technology. Microelectron. Reliab. 80 (2018)
Rob Aitken, Ethan H. Cannon, Mondira Pant, Mehdi Baradaran Tahoori
Resiliency challenges in sub-10nm technologies. VTS (2015)
James D. Warnock, Leon J. Sigal, Dieter F. Wendel, K. Paul Muller, Joshua Friedrich, Victor V. Zyuban, Ethan H. Cannon, A. J. KleinOsowski
local clocking and clocked storage elements. ISSCC (2010)
A. J. KleinOsowski, Ethan H. Cannon, Phil Oldiges, Larry Wissel
Circuit design and modeling for soft errors. IBM J. Res. Dev. 52 (3) (2008)
Michael S. Gordon, Kenneth P. Rodbell, David F. Heidel, Cyril Cabral Jr., Ethan H. Cannon, Daniel D. Reinhardt
Single-event-upset and alpha-particle emission rate measurement techniques. IBM J. Res. Dev. 52 (3) (2008)
David F. Heidel, Kenneth P. Rodbell, Ethan H. Cannon, Cyril Cabral Jr., Michael S. Gordon, Phil Oldiges, Henry H. K. Tang
Alpha-particle-induced upsets in advanced CMOS circuits and technology. IBM J. Res. Dev. 52 (3) (2008)
Jude A. Rivers, Pradip Bose, Prabhakar Kudva, John-David Wellman, Pia N. Sanda, Ethan H. Cannon, Luiz C. Alves
Phaser: Phased methodology for modeling the system-level effects of soft errors. IBM J. Res. Dev. 52 (3) (2008)