Rob Aitken

Publication Activity (10 Years)

Years Active: 2002-2023
Publications (10 Years): 10

Top Topics

Special Session

Innovative Approaches

Emerging Trends

Top Venues

Publications

Robert P. Dick, Rob Aitken, Jace Mogill, John Paul Strachan, Kirk Bresniker, Wei Lu, Yorie Nakahira, Zhiyong Li, Matthew J. Marinella, William Severa, A. Alec Talin, Craig M. Vineyard, Suhas Kumar, Christian Mailhiot, Lennie Klebanoff
Research Challenges for Energy-Efficient Computing in Automated Vehicles. Computer 56 (3) (2023)
Poojitha Amin, Ludmila Cherkasova, Rob Aitken, Vikas Kache
Automating Energy Demand Modeling and Forecasting Using Smart Meter Data. ICIOT (2019)
Rob Aitken, Cecilia Metra
Special Section on Emerging Trends and Design Paradigms for Memory Systems and Storage. IEEE Trans. Emerg. Top. Comput. 7 (3) (2019)
Phani Kishore Gadepalli, Gregor Peach, Ludmila Cherkasova, Rob Aitken, Gabriel Parmer
Challenges and Opportunities for Efficient Serverless Computing at the Edge. SRDS (2019)
Poojitha Amin, Ludmila Cherkasova, Rob Aitken, Vikas Kache
Analysis and Demand Forecasting of Residential Energy Consumption at Multiple Time Scales. IM (2019)
Maria K. Michael, Rolf Drechsler, Stephan Eggersglüß, Haralampos-G. D. Stratigopoulos, Sybille Hellebrand, Rob Aitken
Foreword. ETS (2017)
Rob Aitken
The road to a trillion: Making the IoT work. VLSI-DAT (2017)
Liangzhen Lai, Vikas Chandra, Rob Aitken
Resiliency in dynamically power managed designs. ICCAD (2016)
Rob Aitken
Coordinating Communication, Technology and Design in the IOT Era. ISLPED (2016)
Mehdi Baradaran Tahoori, Rob Aitken, Sriram R. Vangal, Bal Sandhu
Test implications and challenges in near threshold computing special session. VTS (2016)
Rob Aitken
Panel: Is design-for-security the new DFT? VTS (2015)
Rob Aitken, Ethan H. Cannon, Mondira Pant, Mehdi Baradaran Tahoori
Resiliency challenges in sub-10nm technologies. VTS (2015)
Erik Larsson, Bill Eklow, Scott Davidsson, Rob Aitken, Artur Jutman, Christophe Lotz
No Fault Found: The root cause. VTS (2015)
Vikas Chandra, Rob Aitken
Mobile hardware security. Hot Chips Symposium (2014)
Marco Casale-Rossi, Giovanni De Micheli, Rob Aitken, Antun Domic, Manfred Horstmann, Robert Hum, Philippe Magarshack
Panel: Emerging vs. established technologies, a two sphinxes' riddle at the crossroads? DATE (2014)
Peter Beshay, Vikas Chandra, Rob Aitken, Benton H. Calhoun
A digital dynamic write margin sensor for low power read/write operations in 28nm SRAM. ISLPED (2014)
Gordon W. Roberts, Rob Aitken
Welcome message. ITC (2013)
Adrian Evans, Michael Nicolaidis, Rob Aitken, Burcin Aktan, Olivier Lauzeral
Hot topic session 4A: Reliability analysis of complex digital systems. VTS (2013)
Greg Yeric, Brian Cline, Saurabh Sinha, David Pietromonaco, Vikas Chandra, Rob Aitken
The past present and future of design-technology co-optimization. CICC (2013)
Said Hamdioui, Rob Aitken
VLSI Test technology: Why is the field not sexy enough? ETS (2012)
Rob Aitken
Yield Learning Perspectives. IEEE Des. Test Comput. 29 (1) (2012)
Rob Aitken, Greg Yeric, David Flynn
Correlating models and silicon for improved parametric yield. DATE (2011)
Rob Aitken
Time to retire our benchmarks. IEEE Des. Test Comput. 27 (3) (2010)
John Goodenough, Rob Aitken
Post-silicon is too late avoiding the $50 million paperweight starts with validated designs. DAC (2010)
Shidhartha Das, David T. Blaauw, David M. Bull, Krisztián Flautner, Rob Aitken
Addressing design margins through error-tolerant circuits. DAC (2009)
Juan C. Rey, N. S. Nagaraj, Andrew B. Kahng, Fabian Klass, Rob Aitken, Cliff Hou, Luigi Capodieci, Vivek Singh
DFM in practice: hit or hype? DAC (2008)
Rob Aitken
Special Session 4: Reliability and Circuit Simulation. IOLTS (2008)
Rob Aitken, Jerry Bautista, Wojciech Maly, Jan M. Rabaey
More Moore: foolish, feasible, or fundamentally different? ICCAD (2008)
Rob Aitken, Erik Jan Marinissen
Guest Editors' Introduction: Addressing the Challenges of Debug and Diagnosis. IEEE Des. Test Comput. 25 (3) (2008)
Rob Aitken, Stefan Eichenberger, Gary Maier, Sandip Kundu, Hank Walker
ITC 2003 Roundtable: Design for Manufacturability. IEEE Des. Test Comput. 21 (2) (2004)
Carol Stolicny, Tapio Koivukangas, Rubin A. Parekhji, Ian G. Harris, Rob Aitken
ITC 2003 panels: Part 1. IEEE Des. Test Comput. 21 (2) (2004)
Rob Aitken
Test at Gbps: Megaproblem or micromanagement? IEEE Des. Test Comput. 21 (4) (2004)
Rob Aitken, Neeraj Dogra, Dhrumil Gandhi, Scott Becker
Redundancy, Repair, and Test Features of a 90nm Embedded SRAM Generator. DFT (2003)
Julie Segal, Rene Segers, Rob Aitken, S. Eichenberge, A. Gattike, M. Millegen, R. Seger, S. Venkataraman
Test as a Key Enabler for Faster Yield Ramp-Up. VTS (2002)