Redundancy, Repair, and Test Features of a 90nm Embedded SRAM Generator.

Rob Aitken Neeraj Dogra Dhrumil Gandhi Scott Becker

Published in: DFT (2003)

Keyphrases

feature extraction
feature vectors
data sets
neural network
test cases
test data
information content
embedded systems
database
classification accuracy
benchmark datasets
parallel processing
damage assessment