Kenneth P. Rodbell

Publication Activity (10 Years)

Years Active: 1995-2015
Publications (10 Years): 1

Top Topics

Mobile Ad Hoc Networks

Top Venues

Publications

Phil Oldiges, Kenneth P. Rodbell, Michael S. Gordon, John G. Massey, Kevin Stawiasz, Conal E. Murray, Henry H. K. Tang, K. Kim, K. Paul Muller
SOI FinFET soft error upset susceptibility and analysis. IRPS (2015)
Subhasish Mitra, Pradip Bose, Eric Cheng, Chen-Yong Cher, Hyungmin Cho, Rajiv V. Joshi, Young Moon Kim, Charles R. Lefurgy, Yanjing Li, Kenneth P. Rodbell, Kevin Skadron, James H. Stathis, Lukasz G. Szafaryn
The resilience wall: Cross-layer solution strategies. VLSI-DAT (2014)
Michael S. Gordon, Kenneth P. Rodbell, David F. Heidel, Cyril Cabral Jr., Ethan H. Cannon, Daniel D. Reinhardt
Single-event-upset and alpha-particle emission rate measurement techniques. IBM J. Res. Dev. 52 (3) (2008)
David F. Heidel, Jack Hergenrother, Kenneth P. Rodbell
Preface. IBM J. Res. Dev. 52 (3) (2008)
David F. Heidel, Kenneth P. Rodbell, Ethan H. Cannon, Cyril Cabral Jr., Michael S. Gordon, Phil Oldiges, Henry H. K. Tang
Alpha-particle-induced upsets in advanced CMOS circuits and technology. IBM J. Res. Dev. 52 (3) (2008)
Henry H. K. Tang, Conal E. Murray, Giovanni Fiorenza, Kenneth P. Rodbell, Michael S. Gordon, David F. Heidel
New simulation methodology for effects of radiation in semiconductor chip structures. IBM J. Res. Dev. 52 (3) (2008)
Chao-Kun Hu, Kenneth P. Rodbell, Timothy D. Sullivan, Kim Y. Lee, Dennis P. Bouldin
Electromigration and stress-induced voiding in fine Al and Al-alloy thin-film lines. IBM J. Res. Dev. 39 (4) (1995)