Young Moon Kim

Publication Activity (10 Years)

Years Active: 2008-2016
Publications (10 Years): 1

Top Topics

Failure Detection

Constraint Solver

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Ayan Paul, Sang Phill Park, Dinesh Somasekhar, Young Moon Kim, Nitin Borkar, Ulya R. Karpuzcu, Chris H. Kim
System-Level Power Analysis of a Multicore Multipower Domain Processor With ON-Chip Voltage Regulators. IEEE Trans. Very Large Scale Integr. Syst. 24 (12) (2016)
Subhasish Mitra, Pradip Bose, Eric Cheng, Chen-Yong Cher, Hyungmin Cho, Rajiv V. Joshi, Young Moon Kim, Charles R. Lefurgy, Yanjing Li, Kenneth P. Rodbell, Kevin Skadron, James H. Stathis, Lukasz G. Szafaryn
The resilience wall: Cross-layer solution strategies. VLSI-DAT (2014)
Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Matthias Sauer, Bernd Becker, Subhasish Mitra
Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics. CICC (2013)
Matthias Sauer, Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Subhasish Mitra, Bernd Becker
Early-life-failure detection using SAT-based ATPG. ITC (2013)
Subhasish Mitra, Kevin Brelsford, Young Moon Kim, Hsiao-Heng Lee, Yanjing Li
Robust System Design to Overcome CMOS Reliability Challenges. IEEE J. Emerg. Sel. Topics Circuits Syst. 1 (1) (2011)
Subhasish Mitra, Hyungmin Cho, Ted Hong, Young Moon Kim, Hsiao-Heng Lee, Larkhoon Leem, Yanjing Li, David Lin, Evelyn Mintarno, Diana Mui, Sung-Boem Park, Nishant Patil, Hai Wei, Jie Zhang
Robust System Design. IPSJ Trans. Syst. LSI Des. Methodol. 4 (2011)
Young Moon Kim, Tze Wee Chen, Yoshio Kameda, Masayuki Mizuno, Subhasish Mitra
Gate-oxide early-life failure identification using delay shifts. VTS (2010)
Larkhoon Leem, Hyungmin Cho, Hsiao-Heng Lee, Young Moon Kim, Yanjing Li, Subhasish Mitra
Cross-layer error resilience for robust systems. ICCAD (2010)
Yanjing Li, Young Moon Kim, Evelyn Mintarno, Donald S. Gardner, Subhasish Mitra
Overcoming Early-Life Failure and Aging for Robust Systems. IEEE Des. Test Comput. 26 (6) (2009)
Tze Wee Chen, Kyunglok Kim, Young Moon Kim, Subhasish Mitra
Gate-Oxide Early Life Failure Prediction. VTS (2008)