Jung Yun Choi

Publication Activity (10 Years)

Years Active: 2001-2024
Publications (10 Years): 5

Top Topics

Reinforcement Learning

Top Venues

Publications

Hye Rim Ji, Jong Seong Kim, Jung Yun Choi, Jee Hyong Lee
LayNet: Layout Size Prediction for Memory Design Using Graph Neural Networks in Early Design Stage. ASPDAC (2024)
Seyoung Kim, Seungho Yang, Hyein Lim, Hyein Lee, Jongwook Jeon, Jung Yun Choi, Jaeha Kim
Accurate Layout-Dependent Effect Model in 10 nm-Class DRAM Process Using Area-Efficient Array Test Circuits. IEEE Access 11 (2023)
Hyojin Choi, In Huh, Seungju Kim, Jeonghoon Ko, Changwook Jeong, Hyeonsik Son, Kiwon Kwon, Joonwan Chai, Younsik Park, Jaehoon Jeong, Daesin Kim, Jung Yun Choi
Application of Deep Reinforcement Learning to Dynamic Verification of DRAM Designs. DAC (2021)
Jongho Kim, Gunhee Lee, Kiyoung Choi, Yonghwan Kim, Wook Kim, Kyung Tae Do, Jung Yun Choi
Adaptive delay monitoring for wide voltage-range operation. DATE (2016)
Srihari Yechangunja, Raj Shekhar, Mohit Kumar, Nikhil Tripathi, Abhishek Mittal, Abhishek Ranjan, Jianfeng Liu, Minyoung Mo, Kyung Tae Do, Jung Yun Choi, SungHo Park
Sequential analysis driven reset optimization to improve power, area and routability. DATE (2016)
Sungmin Bae, Hyung-Ock Kim, Jung Yun Choi, Jaehong Park
Coarse-grained Structural Placement for a Synthesized Parallel Multiplier. ISPD (2015)
Jianfeng Liu, Mi-Suk Hong, Kyung Tae Do, Jung Yun Choi, Jaehong Park, Mohit Kumar, Manish Kumar, Nikhil Tripathi, Abhishek Ranjan
Clock domain crossing aware sequential clock gating. DATE (2015)
Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Matthias Sauer, Bernd Becker, Subhasish Mitra
Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics. CICC (2013)
Matthias Sauer, Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Subhasish Mitra, Bernd Becker
Early-life-failure detection using SAT-based ATPG. ITC (2013)
Hyung-Ock Kim, Bong Hyun Lee, Jong-Tae Kim, Jung Yun Choi, Kyu-Myung Choi, Youngsoo Shin
Supply Switching With Ground Collapse for Low-Leakage Register Files in 65-nm CMOS. IEEE Trans. Very Large Scale Integr. Syst. 18 (3) (2010)
Youngsoo Shin, Sewan Heo, Hyung-Ock Kim, Jung Yun Choi
Supply Switching With Ground Collapse: Simultaneous Control of Subthreshold and Gate Leakage Current in Nanometer-Scale CMOS Circuits. IEEE Trans. Very Large Scale Integr. Syst. 15 (7) (2007)
Youngsoo Shin, Sewan Heo, Hyung-Ock Kim, Jung Yun Choi
Simultaneous Control of Subthreshold and Gate Leakage Current in Nanometer-Scale CMOS Circuits. ASP-DAC (2007)
Jung Yun Choi, Young Hwan Kim, Kyoung-Rok Cho
Backward Propagated Capacitance Model for Register Transfer Level Power Estimation. VLSI Design 2001 (2) (2001)