Jun Seomun

Publication Activity (10 Years)

Years Active: 2007-2013
Publications (10 Years): 0

Top Topics

Failure Detection

Mathematical Analysis

Constraint Solver

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

Publications

Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Matthias Sauer, Bernd Becker, Subhasish Mitra
Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics. CICC (2013)
Matthias Sauer, Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Subhasish Mitra, Bernd Becker
Early-life-failure detection using SAT-based ATPG. ITC (2013)
Nam Sung Kim, Abhishek A. Sinkar, Jun Seomun, Youngsoo Shin
Maximizing Frequency and Yield of Power-Constrained Designs Using Programmable Power-Gating. IEEE Trans. Very Large Scale Integr. Syst. 20 (10) (2012)
Jun Seomun, Insup Shin, Youngsoo Shin
Synthesis of Active-Mode Power-Gating Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31 (3) (2012)
Chungki Oh, Hyung-Ock Kim, Jun Seomun, Wook Kim, Jaehan Jeon, Kyung Tae Do, Hyo-Sig Won, Kee Sup Kim
Thermal-aware body bias modulation for high performance mobile core. ISOCC (2012)
Jun Seomun, Youngsoo Shin
Design and Optimization of Power-Gated Circuits With Autonomous Data Retention. IEEE Trans. Very Large Scale Integr. Syst. 19 (2) (2011)
Jun Seomun, Seungwhun Paik, Youngsoo Shin
Bounded potential slack: enabling time budgeting for dual-Vt allocation of hierarchical design. ASP-DAC (2010)
Jun Seomun, Insup Shin, Youngsoo Shin
Synthesis and implementation of active mode power gating circuits. DAC (2010)
Youngsoo Shin, Jun Seomun, Kyu-Myung Choi, Takayasu Sakurai
Power gating: Circuits, design methodologies, and best practice for standard-cell VLSI designs. ACM Trans. Design Autom. Electr. Syst. 15 (4) (2010)
Nam Sung Kim, Jun Seomun, Abhishek A. Sinkar, Jungseob Lee, Tae Hee Han, Ken Choi, Youngsoo Shin
Frequency and yield optimization using power gates in power-constrained designs. ISLPED (2009)
Jun Seomun, Jae-Hyun Kim, Youngsoo Shin
Gates for Minimizing Leakage in Sequential Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27 (11) (2008)
Jun Seomun, Jaehyun Kim, Youngsoo Shin
Skewed Flip-Flop Transformation for Minimizing Leakage in Sequential Circuits. DAC (2007)