Kee Sup Kim

Publication Activity (10 Years)

Years Active: 1990-2014
Publications (10 Years): 0

Top Topics

Cmos Technology

Power Management

Failure Detection

Constraint Solver

Top Venues

Publications

Taejoong Song, Woojin Rim, Jonghoon Jung, Giyong Yang, Jaeho Park, Sunghyun Park, Kang-Hyun Baek, Sanghoon Baek, Sang-Kyu Oh, Jinsuk Jung, Sungbong Kim, Gyu-Hong Kim, Jintae Kim, Young-Keun Lee, Kee Sup Kim, Sang-Pil Sim, Jong Shik Yoon, Kyu-Myung Choi
13.2 A 14nm FinFET 128Mb 6T SRAM with VMIN-enhancement techniques for low-power applications. ISSCC (2014)
Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Matthias Sauer, Bernd Becker, Subhasish Mitra
Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics. CICC (2013)
Matthias Sauer, Young Moon Kim, Jun Seomun, Hyung-Ock Kim, Kyung Tae Do, Jung Yun Choi, Kee Sup Kim, Subhasish Mitra, Bernd Becker
Early-life-failure detection using SAT-based ATPG. ITC (2013)
Suk-Soo Pyo, Jun-Sung Kim, Jung-Han Kim, Hyun-Taek Jung, Taejoong Song, Cheol-Ha Lee, Gyun-Hong Kim, Young-Keun Lee, Kee Sup Kim
A 0.65V embedded SDRAM with smart boosting and power management in a 45nm CMOS technology. CICC (2012)
Chungki Oh, Hyung-Ock Kim, Jun Seomun, Wook Kim, Jaehan Jeon, Kyung Tae Do, Hyo-Sig Won, Kee Sup Kim
Thermal-aware body bias modulation for high performance mobile core. ISOCC (2012)
Kee Sup Kim, Rob Roy
Apprentice - VTS edition: Season 4. VTS (2011)
Kee Sup Kim
Holistic low power solutions for the new world. ISLPED (2011)
Kee Sup Kim
Panel 4A: Apprentice - VTS edition: Season 3. VTS (2010)
Kee Sup Kim
Panel 12C: Apprentice - VTS edition judging session. VTS (2010)
A. Hakan Baba, Kee Sup Kim
Framework for massively parallel testing at wafer and package test. ICCD (2009)
Kee Sup Kim
Panel: Apprentice - VTS Edition: Season 2. VTS (2009)
Kee Sup Kim, Ming Zhang
Hierarchical Test Compression for SoC Designs. IEEE Des. Test Comput. 25 (2) (2008)
Ming Zhang, T. M. Mak, James W. Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu
Design for Resilience to Soft Errors and Variations. IOLTS (2007)
Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie
OCI: Open Compression Interface. ITC (2006)
Kee Sup Kim, Mohammad Tehranipoor
Session Abstract. VTS (2006)
Subhasish Mitra, Kee Sup Kim
XPAND: An Efficient Test Stimulus Compression Technique. IEEE Trans. Computers 55 (2) (2006)
Ming Zhang, Subhasish Mitra, T. M. Mak, Norbert Seifert, Nicholas J. Wang, Quan Shi, Kee Sup Kim, Naresh R. Shanbhag, Sanjay J. Patel
Sequential Element Design With Built-In Soft Error Resilience. IEEE Trans. Very Large Scale Integr. Syst. 14 (12) (2006)
Subhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim
Soft Error Resilient System Design through Error Correction. VLSI-SoC (2006)
Subhasish Mitra, Ming Zhang, Norbert Seifert, T. M. Mak, Kee Sup Kim
Soft Error Resilient System Design through Error Correction. VLSI-SoC (Selected Papers) (2006)
Subhasish Mitra, Ming Zhang, Saad Waqas, Norbert Seifert, Balkaran S. Gill, Kee Sup Kim
Combinational Logic Soft Error Correction. ITC (2006)
Subhasish Mitra, Ming Zhang, T. M. Mak, Norbert Seifert, Victor Zia, Kee Sup Kim
Logic soft errors: a major barrier to robust platform design. ITC (2005)
David J. Leavins, Kee Sup Kim, Subhasish Mitra, Eddie J. Rodriguez
Robust platform design in advanced VLSI technologies. CICC (2005)
Nic Mokhoff, Yervant Zorian, Kamalesh N. Ruparel, Hao Nham, Francesco Pessolano, Kee Sup Kim
How to determine the necessity for emerging solutions. DAC (2005)
Kee Sup Kim
XMAX: a practical and efficient compression architecture. ITC (2005)
Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim
Subhasish Mitra, Norbert Seifert, Ming Zhang, Quan Shi, Kee Sup Kim. Computer 38 (2) (2005)
Subhasish Mitra, Kee Sup Kim
X-compact: an efficient response compaction technique. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 23 (3) (2004)
Subhasish Mitra, Kee Sup Kim
XMAX: X-Tolerant Architecture for MAXimal Test Compression. ICCD (2003)
David M. Wu, Mike Lin, Subhasish Mitra, Kee Sup Kim, Anil Sabbavarapu, Talal Jaber, Pete Johnson, Dale March, Greg Parrish
H-DFT: A Hybrid DFT Architecture For Low-Cost High Quality Structural Testing. ITC (2003)
Kee Sup Kim, Subhasish Mitra, Paul G. Ryan
Delay Defect Characteristics and Testing Strategies. IEEE Des. Test Comput. 20 (5) (2003)
Subhasish Mitra, Kee Sup Kim
X-Compact: An Efficient Response Compaction Technique for Test Cost Reduction. ITC (2002)
Kee Sup Kim, Rathish Jayabharathi, Craig Carstens
SpeedGrade: An RTL Path Delay Fault Simulator. Asian Test Symposium (2001)
Kee Sup Kim, Rathish Jayabharathi, Craig Carstens, Praveen Vishakantaiah, Derek Feltham, Adrian Carbine
DPDAT: data path direct access testing. ITC (2001)
Kee Sup Kim, Charles R. Kime
Partial scan flip-flop selection by use of empirical testability. J. Electron. Test. 7 (1-2) (1995)
Kee Sup Kim, Len Schultz
Multi-Frequency, Multi-Phase Scan Chain. ITC (1994)
Kee Sup Kim, Charles R. Kime
Partial Scan Using Reverse Direction Empirical Testability. ITC (1993)
Kee Sup Kim, Charles R. Kime
Partial Scan by Use of Empirical Testability. ICCAD (1990)